INGUN E-TYPE® test probes enable the highest contact security on the PCB/UUT without additional stress. When contacting on the test surface, up to a 100% higher spring force is available, which is achieved by the increased spring pre-load of the E-TYPE probes. During the working stroke, however, the E-TYPE probes have the same spring force as standard test probes. The additional contact energy gained ensures a contact area between the test probe and the PCB which is up to 25% larger.

INGUN E-TYPE® probes are supplied in all current grid sizes (50, 75, 100 Mil), and are compatible with the standard GKS-050/075/100/422 series.

Rotating test probes are recommended for the secure contact of heavily contaminated components, anodised aluminium, or similar plated surfaces.
During the contacting process, the rotating plunger of the test probe pierces the surface of the PCB reliably penetrating the contact surface.

However, it must be taken into consideration that the maintenance rate must be adjusted because of the increased amount of particles.

INGUN DKS-050/075/100 are 100% compatible with the standard series GKS-050/075/100.